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National Repository of Grey Literature 3 records found  Search took 0.01 seconds. 
Scintillation SE Detector for VP SEM
 Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
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Method for evaluation of signal level value in environmental SEM
 Kršňák, Jiří ; Tihlaříková, Eva (referee) ; Čudek, Pavel (advisor)
This work deals with the evaluating of the signal level value from the sample in the environmental SEM. In work there were processed the comparison of the osciloscopic method for the evaluating of the signal level value in the environmental SEM, the method for the evaluating of the signal level from the grey level of the sample images and the method for the evaluating of the signal level from the osciloscop. There are described the advantages and disadvantages of the methods and procedures for processing the methods.
Detailed record
Scintillation SE Detector for VP SEM
 Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
Detailed record

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